Michael A. Shinosky

Affiliations:

IBM Systems and Technology Group, Essex Junction, VT, USA

According to our database¹, Michael A. Shinosky authored at least 5 papers between 2008 and 2015.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of four.

Timeline

Legend:

Book

In proceedings

Article

PhD thesis

Dataset

Other

Links

On csauthors.net:

Bibliography

2015

Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2015

Diagnostic electromigration reliability evaluation with a local sensing structure.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2015

A method for rapid screening of various low-k TDDB models.

[BibT_eX]

[DOI]

Ramachandran Muralidhar

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Electron fluence driven, Cu catalyzed, interface breakdown mechanism for BEOL low-k time dependent dielectric breakdown.

[BibT_eX]

[DOI]

Fen Chen

Michael A. Shinosky

Microelectron. Reliab., 2014

2008

Cu/low-k dielectric TDDB reliability issues for advanced CMOS technologies.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2008

Michael A. Shinosky

Timeline

Legend:

Links

On csauthors.net:

Bibliography

Loading...