Michael H. Schulz

According to our database1, Michael H. Schulz authored at least 15 papers between 1987 and 1992.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

1992
A hierarchical test pattern generation system based on high-level primitives.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992

Robust and Nonrobust Path Delay Fault Simulation by Parallel Processing of Patterns.
IEEE Trans. Computers, 1992

Prüfgerechter Entwurf und Test hochintegrierter Schaltungen.
Inform. Spektrum, 1992

1991
DYNAMITE: an efficient automatic test pattern generation system for path delay faults.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1991

A Test-Pattern-Generation Algorithm for Sequential Circuits.
IEEE Des. Test Comput., 1991

1990
Ein neues, effizientes Verfahren zum Testpunkteeinbau in kombinatorischen Schaltungen.
Proceedings of the Rechnergestützter Entwurf und Architektur mikroelektronischer Systeme, 1990

1989
Improved deterministic test pattern generation with applications to redundancy identification.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1989

Essential: An Efficient Self-Learning Test Pattern Generation Algorithm for Sequential Circuits.
Proceedings of the Proceedings International Test Conference 1989, 1989

Hierarchical Test Pattern Generation Based on High-Level Primitives.
Proceedings of the Proceedings International Test Conference 1989, 1989

Advanced automatic test pattern generation techniques for path delay faults.
Proceedings of the Nineteenth International Symposium on Fault-Tolerant Computing, 1989

Parallel Pattern Fault Simulation of Path Delay Faults.
Proceedings of the 26th ACM/IEEE Design Automation Conference, 1989

1988
SOCRATES: a highly efficient automatic test pattern generation system.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988

Advanced automatic test pattern generation and redundancy identification techniques.
Proceedings of the Eighteenth International Symposium on Fault-Tolerant Computing, 1988

Testmustergenerierung und Fehlersimulation in digitalen Schaltungen mit hoher Komplexität
Informatik-Fachberichte 173, Springer, ISBN: 3-540-50051-0, 1988

1987
Accelerated Fault Simulation and Fault Grading in Combinational Circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1987


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