Nan-Hsin Tseng
According to our database1,
Nan-Hsin Tseng
authored at least 4 papers
between 2011 and 2025.
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Bibliography
2025
Defect-Finding with Timing-Partitioned Small-Delay-Defect Methodology: Silicon Practice on N2.
Proceedings of the IEEE International Test Conference, 2025
Small Delay Defect Diagnosis via Timing-Aware Fault Simulation with Variant Delay Insertion.
Proceedings of the IEEE International Test Conference, 2025
2024
Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2024
2011
Proceedings of the 20th IEEE Asian Test Symposium, 2011