Neal Jaarsma

According to our database¹, Neal Jaarsma authored at least 3 papers between 1999 and 2008.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of four.

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PhD thesis

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Bibliography

2008

Diagnosis of Voltage Dependent Scan Chain Failure Using VBUMP Scan Debug Method.

[BibT_eX]

[DOI]

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2000

Current ratios: a self-scaling technique for production IDDQ testing.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

Current ratios: a self-scaling technique for production I_DDQ testing.

[BibT_eX]

[DOI]

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

Neal Jaarsma

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