Peter C. Maxwell

According to our database, Peter C. Maxwell authored at least 45 papers between 1974 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2021

Defect-Oriented Test: Effectiveness in High Volume Manufacturing.

Friedrich Hapke, Will Howell, Peter C. Maxwell, Edward Brazil, Srikanth Venkataraman, Rudrajit Dutta, Andreas Glowatz, Anja Fast, Janusz Rajski

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

2018

Total Critical Area Based Testing.

Friedrich Hapke, Peter C. Maxwell

Proceedings of the IEEE International Test Conference, 2018

2017

Bridge over troubled waters: Critical area based pattern generation.

Peter C. Maxwell, Friedrich Hapke, Maija Ryynaenen, Peter Weseloh

Proceedings of the 22nd IEEE European Test Symposium, 2017

2016

ETS 2015 best paper.

Hans-Joachim Wunderlich, Peter C. Maxwell

Proceedings of the 21th IEEE European Test Symposium, 2016

Cell-aware diagnosis: Defective inmates exposed in their cells.

Peter C. Maxwell, Friedrich Hapke, Huaxing Tang

Proceedings of the 21th IEEE European Test Symposium, 2016

2012

Adaptive testing: Conquering process variations.

Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu, Peter C. Maxwell

Proceedings of the 17th IEEE European Test Symposium, 2012

2011

Adaptive Testing: Dealing with Process Variability.

Peter C. Maxwell

IEEE Des. Test Comput., 2011

Towards Variation-Aware Test Methods.

Ilia Polian, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, Peter C. Maxwell

Proceedings of the 16th European Test Symposium, 2011

2010

Adaptive test directions.

Peter C. Maxwell

Proceedings of the 15th European Test Symposium, 2010

2007

Principles and results of some test cost reduction methods for ASICs.

Peter C. Maxwell

Proceedings of the 2007 IEEE International Test Conference, 2007

Wafer Level Reliability Screens.

Peter C. Maxwell

Proceedings of the 12th European Test Symposium, 2007

2006

The Design, Implementation and Analysis of Test Experiments.

Peter C. Maxwell

Proceedings of the 2006 IEEE International Test Conference, 2006

2003

Wafer-Package Test Mix for Optimal Defect Detection and Test Time Savings.

Peter C. Maxwell

IEEE Des. Test Comput., 2003

2002

Guest Editors' Introduction: Defect-Oriented Testing in the Deep-Submicron Era.

Jaume Segura, Peter C. Maxwell

IEEE Des. Test Comput., 2002

Debating the Future of Burn-In.

Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Wafer/Package Test Mix for Optimal Defect Detection.

Peter C. Maxwell

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

The Heisenberg Uncertainty of Test.

Peter C. Maxwell

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2000

Deception by design: fooling ourselves with gate-level models.

Peter C. Maxwell, Jeff Rearick

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

Current ratios: a self-scaling technique for production IDDQ testing.

Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

Comparing functional and structural tests.

Peter C. Maxwell, Ismed Hartanto, Lee Bentz

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

Current ratios: a self-scaling technique for production I_DDQ testing.

Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, Ronald Dudley, Neal Jaarsma, Minh Quach, Don Wiseman

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Best Methods for At-Speed Testing?

Peter C. Maxwell, Steve Baird, Wayne M. Needham, Al Crouch, Phil Nigh

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

CMOS IC reliability indicators and burn-in economics.

Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Estimation of defect-free IDDQ in submicron circuits using switch level simulation.

Peter C. Maxwell, Jeff Rearick

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing.

Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken

Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment.

Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

I_DDQ and AC Scan: The War Against Unmodelled Defects.

Peter C. Maxwell, Robert C. Aitken, Kathleen R. Kollitz, Allen C. Brown

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1995

Reductions in quality caused by uneven fault coverage of different areas of an integrated circuit.

Peter C. Maxwell

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995

The use of IDDQ testing in low stuck-at coverage situations.

Peter C. Maxwell

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

The Many Faces of Test Synthesis.

Peter C. Maxwell

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1994

Quality impacts of non-uniform fault coverage.

Peter C. Maxwell

Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability.

Peter C. Maxwell, Robert C. Aitken, Leendert M. Huisman

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1993

Test Sets and Reject Rates: All Fault Coverages are Not Created Equal.

Peter C. Maxwell, Robert C. Aitken

IEEE Des. Test Comput., 1993

Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic.

Peter C. Maxwell, Robert C. Aitken

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

Let's Grade ALL the Faults.

Peter C. Maxwell

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1992

IDDQ testing as a component of a test suite: The need for several fault coverage metrics.

Peter C. Maxwell, Robert C. Aitken

J. Electron. Test., 1992

The Effectiveness of I_DDQ, Functional and Scan Tests: How Many Fault Coverages Do We Need?

Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1991

The Effect of Different Test Sets on Quality Level Prediction: When is 80% better than 90%?

Peter C. Maxwell, Robert C. Aitken, Vic Johansen, Inshen Chiang

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

The Interaction of Test and Quality.

Peter C. Maxwell

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1990

The effectiveness of different test sets for PLAs.

Peter C. Maxwell, Hans-Joachim Wunderlich

Proceedings of the European Design Automation Conference, 1990

1988

Comparative Analysis of Different Implementations of Multiple-Input Signature Analyzers.

Peter C. Maxwell

IEEE Trans. Computers, 1988

1978

Comments on "A Floating Point Multiplexed DDA System".

Philip G. McCrea, Peter C. Maxwell, Paul W. Baker

IEEE Trans. Computers, 1978

1977

Correct DDA Register Transfers for Trapezoidal Integration When Solving Nonlinear Equations of the Form <i>y = A yⁿ</i>.

Peter C. Maxwell

IEEE Trans. Computers, 1977

1976

Incremental Computer Systems.

Peter C. Maxwell, Paul W. Baker, Philip G. McCrea

Aust. Comput. J., 1976

1974

Alternative Descriptions in Line Drawing Analysis.

Peter C. Maxwell

Artif. Intell., 1974