Nobuhiro Yanagida

According to our database, Nobuhiro Yanagida authored at least 6 papers between 1995 and 1999.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

1999

Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators.

Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Nobuhiro Yanagida

Proceedings of the 8th Asian Test Symposium (ATS '99), 1999

1998

Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on Sensitized Paths.

Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu

Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998

1996

Multiple Fault Diagnosis in Sequential Circuits Using Sensitizing Sequence Pairs.

Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu

Proceedings of the Digest of Papers: FTCS-26, 1996

1995

Multiple fault diagnosis in combinational circuits using sensitizing input-pairs.

Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu

Syst. Comput. Jpn., 1995

Multiple Fault Diagnosis by Sensitizing Input Pairs.

Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu

IEEE Des. Test Comput., 1995

Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing.

Hiroshi Takahashi, Nobuhiro Yanagida, Yuzo Takamatsu

Proceedings of the 4th Asian Test Symposium (ATS '95), 1995