Kwame Osei Boateng

According to our database, Kwame Osei Boateng authored at least 13 papers between 1997 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

PSTRM: Privacy-aware sociopsychological trust and reputation model for wireless sensor networks.

Henry Nunoo-Mensah, Kwame Osei Boateng, James Dzisi Gadze

Peer-to-Peer Netw. Appl., 2020

2018

The adoption of socio- and bio-inspired algorithms for trust models in wireless sensor networks: A survey.

Henry Nunoo-Mensah, Kwame Osei Boateng, James D. Gadze

Int. J. Commun. Syst., 2018

2017

Tamper-aware authentication framework for wireless sensor networks.

Henry Nunoo-Mensah, Kwame Osei Boateng, James D. Gadze

IET Wirel. Sens. Syst., 2017

2015

A Retrofit Design Science Methodology for Smart Metering Design in Developing Countries.

Julius Quarshie Azasoo, Kwame Osei Boateng

Proceedings of the 15th International Conference on Computational Science and Its Applications, 2015

2003

BIST-Aided Scan Test - A New Method for Test Cost Reduction.

Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

2002

On diagnosing multiple stuck-at faults using multiple and singlefault simulation in combinational circuits.

Hiroshi Takahashi, Kwame Osei Boateng, Kewal K. Saluja, Yuzo Takamatsu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002

2001

A Method of Static Compaction of Test Stimuli.

Kwame Osei Boateng, Hideaki Konishi, Tsuneo Nakata

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

2000

General BIST-Amenable Method of Test Generation for Iterative Logic Arrays.

Kwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu

Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

1999

A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault Simulations.

Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators.

Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Nobuhiro Yanagida

Proceedings of the 8th Asian Test Symposium (ATS '99), 1999

1998

Diagnosis of Single Gate Delay Faults in Combinational Circuits using Delay Fault Simulation.

Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu

Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998

1997

A Method of Generating Tests for Marginal Delays an Delay Faults in Combinational Circuits.

Hiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Toshiyuki Matsunaga

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997

Design of C-Testable Multipliers Based on the Modified Booth Algorithm.

Kwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997