Noriyoshi Itazaki

According to our database, Noriyoshi Itazaki authored at least 13 papers between 1986 and 2002.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2002

Built-in Self-Test for crosstalk faults in a digital VLSI.

Kazuya Shimizu, Noriyoshi Itazaki, Kozo Kinoshita

Syst. Comput. Jpn., 2002

Fault Simulation Method for Crosstalk Faults in Clock-Delayed Domino CMOS Circuits.

Kazuya Shimizu, Masaya Takamura, Takanori Shirai, Noriyoshi Itazaki, Kozo Kinoshita

Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

Crosstalk Fault Reduction and Simulation for Clock-Delayed Domino Circuits.

Kazuya Shimizu, Noriyoshi Itazaki, Kozo Kinoshita

Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002

2001

Built-in Self-Test for State Faults Induced by Crosstalk in Sequential Circuits.

Kazuya Shimizu, Noriyoshi Itazaki, Kozo Kinoshita

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

1998

Built-In Self-Test for Multiple CLB Faults of a LUT Type FPGA.

Noriyoshi Itazaki, Fumiro Matsuki, Yasuyuki Matsumoto, Kozo Kinoshita

Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998

1997

An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits.

Noriyoshi Itazaki, Yasutaka Idomoto, Kozo Kinoshita

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997

1996

A Fault Simulation Method for Crosstalk Faults in Synchronous Sequential Circuits.

Noriyoshi Itazaki, Yasutaka Idomoto, Kozo Kinoshita

Proceedings of the Digest of Papers: FTCS-26, 1996

1995

Test pattern generation for crosstalk faults considering the gate delay.

Noriyoshi Itazaki, Kozo Kinoshita, Hisao Naitoh

Syst. Comput. Jpn., 1995

1994

An approach to the analysis and detection of crosstalk faults in digital VLSI circuits.

Antonio Rubio, Noriyoshi Itazaki, Xiaole Xu, Kozo Kinoshita

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1994

1991

Stuck-open faults test generation for cmos combinational circuits.

Seiji Kajihara, Noriyoshi Itazaki, Kozo Kinoshita

Syst. Comput. Jpn., 1991

An approach to the analysis and test of crosstalk faults in digital VLSI circuits.

Antonio Rubio, Noriyoshi Itazaki, Xiaole Xu, Kozo Kinoshita

Proceedings of the conference on European design automation, 1991

1989

Test pattern generation for circuits with tri-state modules by Z-algorithm.

Noriyoshi Itazaki, Kozo Kinoshita

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1989

1986

Test Pattern Generation for Circuits with Three-state Modules by Improved Z-algorithm.

Noriyoshi Itazaki, Kozo Kinoshita

Proceedings of the Proceedings International Test Conference 1986, 1986