Paul Theo Gonciari

According to our database, Paul Theo Gonciari authored at least 8 papers between 2002 and 2005.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2005

Synchronization overhead in SOC compressed test.

Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici

IEEE Trans. Very Large Scale Integr. Syst., 2005

2004

A compression-driven test access mechanism design approach.

Paul Theo Gonciari, Bashir M. Al-Hashimi

Proceedings of the 9th European Test Symposium, 2004

2003

Addressing useless test data in core-based system-on-a-chip test.

Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2003

Variable-length input Huffman coding for system-on-a-chip test.

Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2003

Test Data Compression: The System Integrator's Perspective.

Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici

Proceedings of the 2003 Design, 2003

2002

Useless Memory Allocation in System-on-a-Chip Test: Problems and Solutions.

Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Integrated Test Data Decompression and Core Wrapper Design for Low-Cost System-on-a-Chip Testing.

Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-a-Chip Test Data Compression/Decompression.

Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici

Proceedings of the 2002 Design, 2002