Pavel Bolshakov

According to our database, Pavel Bolshakov authored at least 2 papers between 2018 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2019

Positive Bias Instability in ZnO TFTs with Al2O3 Gate Dielectric.

Pavel Bolshakov, Rodolfo A. Rodriguez-Davila, Manuel Quevedo-Lopez, Chadwin D. Young

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Electrical characterization of process induced effects on non-silicon devices.

Chadwin D. Young, Pavel Bolshakov, Rodolfo A. Rodriguez-Davila, Peng Zhao, Ava Khosravi, Israel Mejia, Manuel Quevedo-Lopez, Christopher L. Hinkle, Robert M. Wallace

Proceedings of the 2018 International Conference on IC Design & Technology, 2018