Peter Lidén

According to our database, Peter Lidén authored at least 11 papers between 1991 and 1996.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

1996

A fault model for switch-level simulation of gate-to-drain shorts.

Peter Dahlgren, Peter Lidén

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

1995

Fault Simulation and Physical Fault Injection Applied to MOS Transistor Networks.

Peter Lidén

PhD thesis, 1995

Switch-level modeling of transistor-level stuck-at faults.

Peter Lidén, Peter Dahlgren

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

Coverage of Transistor-Level and Gate-Level Stuck-at Faults in CMOS Checkers.

Peter Lidén, Peter Dahlgren

Proceedings of the 1995 IEEE International Symposium on Circuits and Systems, ISCAS 1995, Seattle, Washington, USA, April 30, 1995

A Switch-level Algorithm for Simulation of Transients in Combinational Logic.

Peter Dahlgren, Peter Lidén

Proceedings of the Digest of Papers: FTCS-25, 1995

1994

Using heavy-ion radiation to validate fault-handling mechanisms.

Johan Karlsson, Peter Lidén, Peter Dahlgren, Rolf Johansson, Ulf Gunneflo

IEEE Micro, 1994

On Latching Probability of Particle Induced Transients in Combinational Networks.

Peter Lidén, Peter Dahlgren, Rolf Johansson, Johan Karlsson

Proceedings of the Digest of Papers: FTCS/24, 1994

Modeling of Intermediate Node States in switch-Level Networks.

Peter Dahlgren, Peter Lidén

Proceedings of the 31st Conference on Design Automation, 1994

1993

Efficient modeling of switch-level networks containing undetermined logic node states.

Peter Dahlgren, Peter Lidén

Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993

1992

Transistor Fault Coverage for Self-Testing CMOS Checkers.

Peter Lidén, Peter Dahlgren, Jan Torin

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1991

Two Fault Injection Techniques for Test of Fault Handling Mechanisms.

Johan Karlsson, Ulf Gunneflo, Peter Lidén, Jan Torin

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991