Peter Dahlgren

According to our database1, Peter Dahlgren authored at least 20 papers between 1992 and 2012.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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PhD thesis 
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Links

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Bibliography

2012
Social Media and Counter-Democracy: The Contingences of Participation.
Proceedings of the Electronic Participation - 4th IFIP WG 8.5 International Conference, 2012

2011
Transition test bring-up and diagnosis on UltraSPARC<sup>TM</sup> processors.
Proceedings of the 2011 IEEE International Test Conference, 2011

2009
Using transition test to understand timing behavior of logic circuits on UltraSPARC<sup>TM</sup> T2 family.
Proceedings of the 2009 IEEE International Test Conference, 2009

2008
Transition Test on UltraSPARC- T2 Microprocessor.
Proceedings of the 2008 IEEE International Test Conference, 2008

2005
Microprocessor silicon debug based on failure propagation tracing.
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2003
Latch Divergency In Microprocessor Failure Analysis.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

1998
Switch-level bridging fault simulation in the presence of feedbacks.
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997
Switch-level modeling of feedback faults using global oscillation control.
Proceedings of the 15th IEEE VLSI Test Symposium (VTS'97), 1997

1996
A fault model for switch-level simulation of gate-to-drain shorts.
Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

Oscillation Control in Logic Simulation using Dynamic Dominance Grahps.
Proceedings of the 33st Conference on Design Automation, 1996

1995
Switch-Level Fault Simulation Based on Local Algorithms.
PhD thesis, 1995

Switch-level modeling of transistor-level stuck-at faults.
Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

Coverage of Transistor-Level and Gate-Level Stuck-at Faults in CMOS Checkers.
Proceedings of the 1995 IEEE International Symposium on Circuits and Systems, ISCAS 1995, Seattle, Washington, USA, April 30, 1995

A multiple-dominance switch-level model for simulation of short faults.
Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design, 1995

A Switch-level Algorithm for Simulation of Transients in Combinational Logic.
Proceedings of the Digest of Papers: FTCS-25, 1995

1994
Using heavy-ion radiation to validate fault-handling mechanisms.
IEEE Micro, 1994

On Latching Probability of Particle Induced Transients in Combinational Networks.
Proceedings of the Digest of Papers: FTCS/24, 1994

Modeling of Intermediate Node States in switch-Level Networks.
Proceedings of the 31st Conference on Design Automation, 1994

1993
Efficient modeling of switch-level networks containing undetermined logic node states.
Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993

1992
Transistor Fault Coverage for Self-Testing CMOS Checkers.
Proceedings of the Proceedings IEEE International Test Conference 1992, 1992


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