Peter Zeitzoff

According to our database, Peter Zeitzoff authored at least 4 papers between 2004 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

Effective Drive Current in Scaled FinFET and NSFET CMOS Inverters.

Ali Razavieh, Y. Deng, Peter Zeitzoff, M. R. Na, J. Frougier, Gauri Karve, D. E. Brown, T. Yamashita, Edward J. Nowak

Proceedings of the 76th Device Research Conference, 2018

2005

Probing stress effects in HfO₂ gate stacks with time dependent measurements.

Chadwin D. Young, Gennadi Bersuker, Yuegang Zhao, Jeff J. Peterson, Joel Barnett, George A. Brown, Jang H. Sim, Rino Choi, Byoung Hun Lee, Peter Zeitzoff

Microelectron. Reliab., 2005

2004

Effect of Pre-Existing Defects on Reliability Assessment of High-K Gate Dielectrics.

Gennadi Bersuker, Jang H. Sim, Chadwin D. Young, Rino Choi, Peter Zeitzoff, George A. Brown, Byoung Hun Lee, Robert W. Murto

Microelectron. Reliab., 2004

MOSFET scaling trends and challenges through the end of the roadmap.

Peter M. Zeitzoff

Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, 2004