Rino Choi

Orcid: 0000-0003-0604-7849

According to our database¹, Rino Choi authored at least 8 papers between 2004 and 2022.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of five.

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PhD thesis

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2022

3-Dimensional Integration with High Interconnection Density.

[BibT_eX]

[DOI]

Rino Choi

Ye-Eun Hong

Anh Duy Nguyen

Proceedings of the International Conference on IC Design and Technology, 2022

2016

Characterization of high pressure hydrogen annealing effect on polysilicon channel field effect transistors using isothermal deep level trap spectroscopy.

[BibT_eX]

[DOI]

Proceedings of the International Conference on IC Design and Technology, 2016

2008

A novel approach to characterization of progressive breakdown in high-k/metal gate stacks.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2008

2007

Electrical characterization and analysis techniques for the high-kappa era.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2007

Applications of DCIV method to NBTI characterization.

[BibT_eX]

[DOI]

Arnost Neugroschel

Gennadi Bersuker

Rino Choi

Microelectron. Reliab., 2007

2005

Probing stress effects in HfO<sub>2</sub> gate stacks with time dependent measurements.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2005

2004

Reliability of High-K Dielectrics and Its Dependence on Gate Electrode and Interfacial / High-K Bi-Layer Structure.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2004

Effect of Pre-Existing Defects on Reliability Assessment of High-K Gate Dielectrics.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2004

Rino Choi

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