Prabhakar Goel

According to our database1, Prabhakar Goel authored at least 10 papers between 1974 and 1988.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

1988
Benchmarking of Test-Generation Systems.
Proceedings of the COMPCON'88, Digest of Papers, Thirty-Third IEEE Computer Society International Conference, San Francisco, California, USA, February 29, 1988

1986
Application of Parallel Processing to Fault Simulation.
Proceedings of the International Conference on Parallel Processing, 1986

1985
Statistical Fault Sampling and Full Fault Simulation.
Proceedings of the Proceedings International Test Conference 1985, 1985

1984
Testability Analysis will not Replace Fault Simulation.
Proceedings of the Proceedings International Test Conference 1984, 1984

1982
Electronic Chip-In-Place Test.
Proceedings of the Proceedings International Test Conference 1982, 1982

A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI.
Proceedings of the Proceedings International Test Conference 1982, 1982

1981
An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits.
IEEE Trans. Computers, 1981

PODEM-X: An automatic test generation system for VLSI logic structures.
Proceedings of the 18th Design Automation Conference, 1981

1980
Test generation costs analysis and projections.
Proceedings of the 17th Design Automation Conference, 1980

1974
Comments on "Multiple Fault Detection in Combinational Networks".
IEEE Trans. Computers, 1974


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