Rene Segers

According to our database1, Rene Segers authored at least 4 papers between 2002 and 2007.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2007
If It's All about Yield, Why Talk about Testing?
Proceedings of the 12th European Test Symposium, 2007

2003
On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up.
J. Electron. Test., 2003

2002
Test as a Key Enabler for Faster Yield Ramp-Up.
Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

An Effective Diagnosis Method to Support Yield Improvement.
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002


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