Maurice Lousberg

According to our database1, Maurice Lousberg authored at least 16 papers between 1998 and 2007.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2007
Diagnosis of Full Open Defects in Interconnecting Lines.
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

2005
A New Algorithm for Dynamic Faults Detection in RAMs.
Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

Memory Testing Under Different Stress Conditions: An Industrial Evaluation.
Proceedings of the 2005 Design, 2005

IEEE Std 1500 Compliant Infrastructure forModular SOC Testing.
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

2003
On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up.
J. Electron. Test., 2003

Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model.
Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

2002
On IEEE P1500's Standard for Embedded Core Test.
J. Electron. Test., 2002

An Effective Diagnosis Method to Support Yield Improvement.
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001
IP and Automation to Support IEEE P1500.
Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

CTL the language for describing core-based test.
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000
Wrapper design for embedded core test.
Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?
Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999
Static component interconnect test technology (SCITT) a new technology for assembly testing.
Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

The role of test protocols in testing embedded-core-based system ICs.
Proceedings of the 4th European Test Workshop, 1999

1998
A structured and scalable mechanism for test access to embedded reusable cores.
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998


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