Richard M. Sedmak

According to our database, Richard M. Sedmak authored at least 7 papers between 1980 and 2001.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2001

Unsafe board states during PC-based boundary-scan testing.

William Eklow, Richard M. Sedmak, Dan Singletary, Toai Vo

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1996

Spanning the Product Life Cycle: RASSP DFT.

Richard M. Sedmak, John S. Evans

IEEE Des. Test Comput., 1996

1995

A Hierarchical, Desgin-for-Testability (DFT) Methodology for the Rapid Prototyping of Application-Specific Signal Processors (RASSP).

Richard M. Sedmak, John Evans

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1986

On the Possible Limits of External Testing.

Richard M. Sedmak

Proceedings of the Proceedings International Test Conference 1986, 1986

1984

Probing the State of the Art.

Richard M. Sedmak, Donald E. Thomas

IEEE Des. Test, 1984

1982

Self-Test Chip to System Level Approaches.

Richard M. Sedmak

Proceedings of the Proceedings International Test Conference 1982, 1982

1980

Fault Tolerance of a General Purpose Computer Implemented by Very Large Scale Integration.

Richard M. Sedmak, Harris L. Liebergot

IEEE Trans. Computers, 1980