Bill Eklow

According to our database, Bill Eklow authored at least 39 papers between 1994 and 2016.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2016

A Distributed, Reconfigurable, and Reusable BIST Infrastructure for Test and Diagnosis of 3-D-Stacked ICs.

Mukesh Agrawal, Krishnendu Chakrabarty, Bill Eklow

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Recap of the ITC15 Test Conference.

Bill Eklow

IEEE Des. Test, 2016

2015

No Fault Found: The root cause.

Erik Larsson, Bill Eklow, Scott Davidsson, Rob Aitken, Artur Jutman, Christophe Lotz

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

2014

Scan-Based Testing of Post-Bond Silicon Interposer Interconnects in 2.5-D ICs.

Ran Wang, Krishnendu Chakrabarty, Bill Eklow

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014

Protecting against emerging vmin failures in advanced technology nodes.

J. K. Jerry Lee, Amr Haggag, William Eklow

Proceedings of the 2014 International Test Conference, 2014

A distributed, reconfigurable, and reusable bist infrastructure for 3D-stacked ICs.

Mukesh Agrawal, Krishnendu Chakrabarty, Bill Eklow

Proceedings of the 2014 International Test Conference, 2014

An All Digital Distributed Sensor Network Based Framework for Continuous Noise Monitoring and Timing Failure Analysis in SoCs.

Mehdi Sadi, Zoe Conroy, Bill Eklow, Matthias Kamm, Nematollah Bidokhti, Mark Mohammad Tehranipoor

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2013

On Effective Through-Silicon Via Repair for 3-D-Stacked ICs.

Li Jiang, Qiang Xu, Bill Eklow

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013

On effective and efficient in-field TSV repair for stacked 3D ICs.

Li Jiang, Fangming Ye, Qiang Xu, Krishnendu Chakrabarty, Bill Eklow

Proceedings of the 50th Annual Design Automation Conference 2013, 2013

Post-bond Testing of the Silicon Interposer and Micro-bumps in 2.5D ICs.

Ran Wang, Krishnendu Chakrabarty, Bill Eklow

Proceedings of the 22nd Asian Test Symposium, 2013

2012

Managing Complex Boundary-Scan Operations.

Bill Eklow

IEEE Des. Test Comput., 2012

FALCON: Rapid statistical fault coverage estimation for complex designs.

Shahrzad Mirkhani, Jacob A. Abraham, Toai Vo, Hong Shin Jun, Bill Eklow

Proceedings of the 2012 IEEE International Test Conference, 2012

Re-using chip level DFT at board level.

Xinli Gu, Jeff Rearick, Bill Eklow, Martin Keim, Jun Qian, Artur Jutman, Krishnendu Chakrabarty, Erik Larsson

Proceedings of the 17th IEEE European Test Symposium, 2012

On effective TSV repair for 3D-stacked ICs.

Li Jiang, Qiang Xu, Bill Eklow

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

Yield enhancement for 3D-stacked ICs: Recent advances and challenges.

Qiang Xu, Li Jiang, Huiyun Li, Bill Eklow

Proceedings of the 17th Asia and South Pacific Design Automation Conference, 2012

2011

Major Milestones for Two IEEE Standards Groups in 2011.

Bill Eklow

IEEE Des. Test Comput., 2011

2009

An Incremental Approach to Functional Diagnosis.

Luca Amati, Cristiana Bolchini, Laura Frigerio, Fabio Salice, William Eklow, Arnold Suvatne, Eugenio Brambilla, Federico Franzoso, Michele Martin

Proceedings of the 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009

2008

Embedded Testing in an In-Circuit Test Environment.

John Malian, Bill Eklow

Proceedings of the 2008 IEEE International Test Conference, 2008

Parametric Testing of Optical Interfaces.

Brice Achkir, Pavel Zivny, Bill Eklow

Proceedings of the 2008 IEEE International Test Conference, 2008

2006

Test Economics - What can a Board/System Test Engineer do to Influence Supply Operation Metrics.

Sylvain Tourangeau, Bill Eklow

Proceedings of the 2006 IEEE International Test Conference, 2006

IEEE P1687: Toward Standardized Access of Embedded Instrumentation.

Ken Posse, Al Crouch, Jeff Rearick, Bill Eklow, Mike Laisne, Ben Bennetts, Jason Doege, Mike Ricchetti, Jean-Francois Cote

Proceedings of the 2006 IEEE International Test Conference, 2006

New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG).

Bill Eklow, Ben Bennetts

Proceedings of the 11th European Test Symposium, 2006

2005

IJTAG (internal JTAG): a step toward a DFT standard.

Jeff Rearick, Bill Eklow, Ken Posse, Al Crouch, Ben Bennetts

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Optimized reasoning-based diagnosis for non-random, board-level, production defects.

Carlos O'Farrill, Merouane Moakil-Chbany, Bill Eklow

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

An update on IEEE 1149.6 - successes and issues.

Bill Eklow

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

A practical perspective on reducing ASIC NTFs.

Zoe Conroy, Geoff Richmond, Xinli Gu, Bill Eklow

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

"Real Life" System Testing of Networking Equipment.

Sunil Kalidindi, Nghia Huynh, Bill Eklow, Josh Goldstein

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Realizing High Test Quality Goals with Smart Test Resource Usage.

Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Simulation Based System Level Fault Insertion Using Co-verification Tools.

Bill Eklow, Anoosh Hosseini, Chi Khuong, Shyam Pullela, Toai Vo, Hien Chau

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

What Do You Mean My Board Test Stinks?

Bill Eklow

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Status of IEEE Testability Standards 1149.4, 1532 and 1149.6.

Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil G. Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts

Proceedings of the 2004 Design, 2004

IP Testing - The Future Differentiator?

Bill Eklow

Proceedings of the 2004 Design, 2004

2003

IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks.

Bill Eklow, Carl Barnhart, Kenneth P. Parker

IEEE Des. Test Comput., 2003

IEEE 1149.6 - A Practical Perspective.

Bill Eklow, Carl Barnhart, Mike Ricchetti, Terry Borroz

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks.

Bill Eklow, Carl Barnhart, Kenneth P. Parker

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Is Board Test Worth Talking About?

Bill Eklow

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Unsafe board states during PC-based boundary-scan testing.

William Eklow, Richard M. Sedmak, Dan Singletary, Toai Vo

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1998

Shared I/O-cell structures: a framework for extending the IEEE 1149.1 boundary-scan standard.

Bulent I. Dervisoglu, Mike Ricchetti, William Eklow

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1994

Optimizing Boundary Scan in a Proprietary Environment.

William Eklow

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994