Richun Fei

According to our database, Richun Fei authored at least 2 papers between 2013 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Horizontal-FPN fault coverage improvement in production test of CMOS imagers.

Richun Fei, Jocelyn Moreau, Salvador Mir, Alexis Marcellin, C. Mandier, E. Huss, G. Palmigiani, P. Vitrou, Thomas Droniou

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

2013

BIST of interconnection lines in the pixel matrix of CMOS imagers.

Richun Fei, Jocelyn Moreau, Salvador Mir

Proceedings of the 5th IEEE International Workshop on Advances in Sensors and Interfaces, 2013