Salvador Mir
Orcid: 0000-0001-9911-8946
According to our database1,
Salvador Mir
authored at least 135 papers
between 1994 and 2023.
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Bibliography
2023
Proceedings of the 31st IFIP/IEEE International Conference on Very Large Scale Integration, 2023
A sub-picosecond resolution jitter instrument for GHz frequencies based on a sub-sampling TDA.
Proceedings of the 21st IEEE Interregional NEWCAS Conference, 2023
Special Session: A high-frequency sinusoidal signal generation using harmonic cancellation.
Proceedings of the 24th IEEE Latin American Test Symposium, 2023
Special Session: On-chip jitter BIST with sub-picosecond resolution at GHz frequencies.
Proceedings of the 24th IEEE Latin American Test Symposium, 2023
A harmonic cancellation-based high-frequency on-chip sinusoidal signal generator with calibration using a coarse-fine delay cell.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2023
2022
Proceedings of the 40th IEEE VLSI Test Symposium, 2022
A self-referenced on-chip jitter BIST with sub-picosecond resolution in 28 nm FD-SOI technology.
Proceedings of the 30th IFIP/IEEE 30th International Conference on Very Large Scale Integration, 2022
On-chip calibration for high-speed harmonic cancellation-based sinusoidal signal generators.
Proceedings of the IEEE 31st Asian Test Symposium, 2022
2021
Analysis and mitigation of timing inaccuracies in high-frequency on-chip sinusoidal signal generators based on harmonic cancellation.
Proceedings of the 26th IEEE European Test Symposium, 2021
2020
Estimation of Analog/RF Parametric Test Metrics Based on a Multivariate Extreme Value Model.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020
Static linearity BIST for V<sub>cm</sub>-based switching SAR ADCs using a reduced-code measurement technique.
Proceedings of the 18th IEEE International New Circuits and Systems Conference, 2020
A Comprehensive End-to-end Solution for a Secure and Dynamic Mixed-signal 1687 System.
Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020
On-chip reduced-code static linearity test of V<sub>cm</sub>-based switching SAR ADCs using an incremental analog-to-digital converter.
Proceedings of the IEEE European Test Symposium, 2020
2019
Fully Differential 4-V Output Range 14.5-ENOB Stepwise Ramp Stimulus Generator for On-Chip Static Linearity Test of ADCs.
IEEE Trans. Very Large Scale Integr. Syst., 2019
Proceedings of the 27th IFIP/IEEE International Conference on Very Large Scale Integration, 2019
Efficient generation of data sets for one-shot statistical calibration of RF/mm-wave circuits.
Proceedings of the 16th International Conference on Synthesis, 2019
Yield Recovery of mm-Wave Power Amplifiers using Variable Decoupling Cells and One-Shot Statistical Calibration.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2019
A 52 dB-SFDR 166 MHz sinusoidal signal generator for mixed-signal BIST applications in 28 nm FDSOI technology.
Proceedings of the 24th IEEE European Test Symposium, 2019
On the use of causal feature selection in the context of machine-learning indirect test.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019
2018
Practical Harmonic Cancellation Techniques for the On-Chip Implementation of Sinusoidal Signal Generators for Mixed-Signal BIST Applications.
J. Electron. Test., 2018
Reduced-code static linearity test of SAR ADCs using a built-in incremental ∑Δ converter.
Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018
Assisted test design for non-intrusive machine learning indirect test of millimeter-wave circuits.
Proceedings of the 23rd IEEE European Test Symposium, 2018
2017
Analysis of an efficient on-chip servo-loop technique for reduced-code static linearity test of pipeline ADCs.
Proceedings of the 35th IEEE VLSI Test Symposium, 2017
Proceedings of the 22nd IEEE European Test Symposium, 2017
Design of a sinusoidal signal generator with calibrated harmonic cancellation for mixed-signal BIST in a 28 nm FDSOI technology.
Proceedings of the 22nd IEEE European Test Symposium, 2017
2016
A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ΣΔ ADC.
IEEE Trans. Circuits Syst. I Regul. Pap., 2016
A 65nm CMOS Ramp Generator Design and its Application Towards a BIST Implementation of the Reduced-Code Static Linearity Test Technique for Pipeline ADCs.
J. Electron. Test., 2016
IEEE Des. Test, 2016
Linearity test of high-speed high-performance ADCs using a self-testable on-chip generator.
Proceedings of the 21th IEEE European Test Symposium, 2016
Proceedings of the Image Sensors and Imaging Systems 2016, 2016
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016
2015
ACM Trans. Design Autom. Electr. Syst., 2015
IEEE Trans. Circuits Syst. I Regul. Pap., 2015
Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors.
J. Electron. Test., 2015
Proceedings of the 33rd IEEE VLSI Test Symposium, 2015
Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times.
Proceedings of the 2015 IEEE International Test Conference, 2015
Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI, 2015
Proceedings of the 20th IEEE European Test Symposium, 2015
2014
Proceedings of the VLSI-SoC: Internet of Things Foundations, 2014
Proceedings of the 22nd International Conference on Very Large Scale Integration, 2014
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes.
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014
Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014
Proceedings of the 9th International Design and Test Symposium, 2014
On-Chip Implementation of an Integrator-Based Servo-Loop for ADC Static Linearity Test.
Proceedings of the 23rd IEEE Asian Test Symposium, 2014
2013
Proceedings of the 31st IEEE VLSI Test Symposium, 2013
Proceedings of the 31st IEEE VLSI Test Symposium, 2013
Minimizing Test Frequencies for Linear Analog Circuits: New Models and Efficient Solution Methods.
Proceedings of the VLSI-SoC: At the Crossroads of Emerging Trends, 2013
Proceedings of the 21st IEEE/IFIP International Conference on VLSI and System-on-Chip, 2013
Proceedings of the 5th IEEE International Workshop on Advances in Sensors and Interfaces, 2013
Proceedings of the 2013 IEEE International Test Conference, 2013
Proceedings of the 2013 IEEE International Test Conference, 2013
Proceedings of the 18th IEEE European Test Symposium, 2013
Proceedings of the 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2013
Proceedings of the 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2013
2012
Proceedings of the 30th IEEE VLSI Test Symposium, 2012
Proceedings of the 2012 IEEE International Test Conference, 2012
Proceedings of the 19th IEEE International Conference on Electronics, Circuits and Systems, 2012
Proceedings of the 17th IEEE European Test Symposium, 2012
Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012
2011
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011
Proceedings of the 20th European Conference on Circuit Theory and Design, 2011
Proceedings of the 20th IEEE Asian Test Symposium, 2011
2010
Microelectron. J., 2010
Proceedings of the 28th IEEE VLSI Test Symposium, 2010
Proceedings of the 28th IEEE VLSI Test Symposium, 2010
Proceedings of the VLSI-SoC: Forward-Looking Trends in IC and Systems Design, 2010
Proceedings of the 2010 International Conference on Computer-Aided Design, 2010
Proceedings of the 15th European Test Symposium, 2010
Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010
Proceedings of the Design, Automation and Test in Europe, 2010
Proceedings of the 19th IEEE Asian Test Symposium, 2010
2009
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009
Microelectron. J., 2009
Proceedings of the 27th IEEE VLSI Test Symposium, 2009
Proceedings of the 9th IFAC Workshop on Programmable Devices and Embedded Systems, 2009
Proceedings of the 27th International Conference on Computer Design, 2009
Proceedings of the 14th IEEE European Test Symposium, 2009
Proceedings of the Design, Automation and Test in Europe, 2009
2008
VLSI Design, 2008
A General Method to Evaluate RF BIST Techniques Based on Non-parametric Density Estimation.
Proceedings of the Design, Automation and Test in Europe, 2008
2007
J. Electron. Test., 2007
Proceedings of the 2007 IEEE International Test Conference, 2007
Envelope Detection Based Transition Time Supervision for Online Testing of RF MEMS Switches.
Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007
Interactive presentation: Evaluation of test measures for LNA production testing using a multinormal statistical model.
Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007
Proceedings of the 16th Asian Test Symposium, 2007
Proceedings of the 16th Asian Test Symposium, 2007
2006
J. Electron. Test., 2006
Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006
Proceedings of the IFIP VLSI-SoC 2006, 2006
Proceedings of the VLSI-SoC: Research Trends in VLSI and Systems on Chip, 2006
Proceedings of the Conference on Design, Automation and Test in Europe, 2006
2005
A low-cost digital frequency testing approach for mixed-signal devices using SigmaDelta modulation.
Microelectron. J., 2005
Proceedings of the VLSI-SoC: From Systems To Silicon, 2005
Evaluation of impulse response-based BIST techniques for MEMS in the presence of weak nonlinearities.
Proceedings of the 10th European Test Symposium, 2005
Proceedings of the 31st European Solid-State Circuits Conference, 2005
Proceedings of the 2005 Design, 2005
2004
Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004
Proceedings of the Proceedings 2004 IEEE International SOC Conference, 2004
Proceedings of the 9th European Test Symposium, 2004
A 0.18 µm CMOS Implementation of On-chip Analogue Test Signal Generation from Digital Test Patterns.
Proceedings of the 2004 Design, 2004
2003
Microelectron. J., 2003
Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003
Proceedings of the 2003 Asia and South Pacific Design Automation Conference, 2003
2002
Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002
2001
J. Electron. Test., 2001
Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001
An Analog-based Approach for MEMS Testing.
Proceedings of the 2nd Latin American Test Workshop, 2001
2000
IEEE Trans. Very Large Scale Integr. Syst., 2000
J. Electron. Test., 2000
Proceedings of the 10th ACM Great Lakes Symposium on VLSI 2000, 2000
1999
IEEE Des. Test Comput., 1999
Proceedings of the 12th International Conference on VLSI Design (VLSI Design 1999), 1999
Proceedings of the Proceedings IEEE International Test Conference 1999, 1999
1998
Proceedings of the 11th Annual Symposium on Integrated Circuits Design, 1998
Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems.
Proceedings of the Proceedings IEEE International Test Conference 1998, 1998
Proceedings of the 1998 Design, 1998
1997
SWITTEST: Automatic Switch-Level Fault Simulation and Test Evaluation of Switched-Capacitor Systems.
Proceedings of the 34st Conference on Design Automation, 1997
1996
J. Electron. Test., 1996
Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets.
J. Electron. Test., 1996
Design of high-performance band-pass sigma-delta modulator with concurrent error detection.
Proceedings of Third International Conference on Electronics, Circuits, and Systems, 1996
Proceedings of the 1996 IEEE/ACM International Conference on Computer-Aided Design, 1996
Proceedings of the 1996 European Design and Test Conference, 1996
1995
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995
Proceedings of the 1995 European Design and Test Conference, 1995
1994
Proceedings of the 1994 IEEE/ACM International Conference on Computer-Aided Design, 1994
Proceedings of the Proceedings EURO-DAC'94, 1994