Robert Specht

According to our database, Robert Specht authored at least 9 papers between 2014 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2025

An Outlook on the Opportunities and Challenges of Multi-Agent AI Systems.

Fangqiao Tian, An Luo, Jin Du, Xun Xian, Robert Specht, Ganghua Wang, Xuan Bi, Jiawei Zhou, Jayanth Srinivasa, Ashish Kundu, Charles Fleming, Rui Zhang, Zirui Liu, Mingyi Hong, Jie Ding

CoRR, May, 2025

2019

High Resolution EM Side Channel Attacks with Multiple Measurement Probes.

Robert Specht

PhD thesis, 2019

2018

Your rails cannot hide from localized EM: how dual-rail logic fails on FPGAs - extended version.

Vincent Immler, Robert Specht, Florian Unterstein

J. Cryptogr. Eng., 2018

Dividing the threshold: Multi-probe localized EM analysis on threshold implementations.

Robert Specht, Vincent Immler, Florian Unterstein, Johann Heyszl, Georg Sigl

Proceedings of the 2018 IEEE International Symposium on Hardware Oriented Security and Trust, 2018

High-Resolution EM Attacks Against Leakage-Resilient PRFs Explained - And an Improved Construction.

Florian Unterstein, Johann Heyszl, Fabrizio De Santis, Robert Specht, Georg Sigl

Proceedings of the Topics in Cryptology - CT-RSA 2018, 2018

2017

Dissecting Leakage Resilient PRFs with Multivariate Localized EM Attacks - A Practical Security Evaluation on FPGA.

Florian Unterstein, Johann Heyszl, Fabrizio De Santis, Robert Specht

Proceedings of the Constructive Side-Channel Analysis and Secure Design, 2017

Your Rails Cannot Hide from Localized EM: How Dual-Rail Logic Fails on FPGAs.

Vincent Immler, Robert Specht, Florian Unterstein

Proceedings of the Cryptographic Hardware and Embedded Systems - CHES 2017, 2017

2015

Improving Non-profiled Attacks on Exponentiations Based on Clustering and Extracting Leakage from Multi-channel High-Resolution EM Measurements.

Robert Specht, Johann Heyszl, Martin Kleinsteuber, Georg Sigl

Proceedings of the Constructive Side-Channel Analysis and Secure Design, 2015

2014

Investigating measurement methods for high-resolution electromagnetic field side-channel analysis.

Robert Specht, Johann Heyszl, Georg Sigl

Proceedings of the 2014 International Symposium on Integrated Circuits (ISIC), 2014