Roman Boldyrjew-Mast

Orcid: 0009-0006-6131-1285

According to our database1, Roman Boldyrjew-Mast authored at least 2 papers between 2020 and 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2025
Influence of the Gate Switching Instability Induced Threshold Voltage Drift on the Hard Switching Behavior of 1.2 kV SiC MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2025

2020
Thermomechanical behaviour of inverse diode in SiC MOSFETs under surge current stress.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020


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