Roman Boldyrjew-Mast
Orcid: 0009-0006-6131-1285
According to our database1,
Roman Boldyrjew-Mast
authored at least 2 papers
between 2020 and 2025.
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Bibliography
2025
Influence of the Gate Switching Instability Induced Threshold Voltage Drift on the Hard Switching Behavior of 1.2 kV SiC MOSFETs.
Proceedings of the IEEE International Reliability Physics Symposium, 2025
2020
Thermomechanical behaviour of inverse diode in SiC MOSFETs under surge current stress.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020