Josef Lutz
Orcid: 0000-0001-5227-4220
According to our database1,
Josef Lutz
authored at least 27 papers
between 2003 and 2021.
Collaborative distances:
Collaborative distances:
Timeline
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Online presence:
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Bibliography
2021
Investigation of the bipolar degradation of SiC MOSFET body diodes and the influence of current density.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
2020
Thermomechanical behaviour of inverse diode in SiC MOSFETs under surge current stress.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2018
Microelectron. Reliab., 2018
Microelectron. Reliab., 2018
Unified view on energy and electrical failure of the short-circuit operation of IGBTs.
Microelectron. Reliab., 2018
2016
Microelectron. Reliab., 2016
Microelectron. Reliab., 2016
Internal processes in power semiconductors at virtual junction temperature measurement.
Microelectron. Reliab., 2016
2015
2014
Switching ruggedness and surge-current capability of diodes using the self-adjusting p emitter efficiency diode concept.
IET Circuits Devices Syst., 2014
2013
Microelectron. Reliab., 2013
Influence of the clamping pressure on the electrical, thermal and mechanical behaviour of press-pack IGBTs.
Microelectron. Reliab., 2013
2012
A simplified algorithm for predicting power cycling lifetime in Direct Drive wind power systems.
Proceedings of the International Multi-Conference on Systems, Signals & Devices, 2012
Proceedings of the International Multi-Conference on Systems, Signals & Devices, 2012
2011
2008
Ruggedness analysis of 3.3 kV high voltage diodes considering various buffer structures and edge terminations.
Microelectron. J., 2008
2007
Influence of parasitic inductances on transient current sharing in parallel connected synchronous rectifiers and Schottky-barrier diodes.
IET Circuits Devices Syst., 2007
IET Circuits Devices Syst., 2007
2006
Compensation and doping effects in heavily helium-radiated silicon for power device applications.
Microelectron. J., 2006
2004
Possibilities and limits of axial lifetime control by radiation induced centers in fast recovery diodes.
Microelectron. J., 2004
2003
Microelectron. Reliab., 2003