Ronald Green

According to our database, Ronald Green authored at least 5 papers between 1971 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2020

Towards a Robust Approach to Threshold Voltage Characterization and High Temperature Gate Bias Qualification.

Daniel B. Habersat, Aivars J. Lelis, Ronald Green

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Permanent and Transient Effects of High-Temperature Bias Stress on Room- Temperature $V_{T}$ Drift Measurements in SiC Power MOSFETs.

Daniel B. Habersat, Ronald Green, Aivars J. Lelis

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Measurement considerations for evaluating BTI effects in SiC MOSFETs.

Daniel B. Habersat, Aivars J. Lelis, Ronald Green

Microelectron. Reliab., 2018

1994

Technology Transfer of Software Reuse (panel).

James Baldo, Patricia Collins, Robert Steigerwald, Dewayne Barrington, Ronald Green, Donald J. Reifer

Proceedings of the 1994 Conference on TRI-Ada 1994, 1994

1971

The BBC Television Management Information System.

Charles Lashmar, Terry Smith, John Collins, Ronald Green

Proceedings of the Information Processing, Proceedings of IFIP Congress 1971, Volume 2, 1971