Sang Jin Byeon

According to our database¹, Sang Jin Byeon authored at least 2 papers between 2014 and 2015.

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2015

A 1.2 V 8 Gb 8-Channel 128 GB/s High-Bandwidth Memory (HBM) Stacked DRAM With Effective I/O Test Circuits.

[BibT_eX]

[DOI]

IEEE J. Solid State Circuits, 2015

2014

An exact measurement and repair circuit of TSV connections for 128GB/s high-bandwidth memory(HBM) stacked DRAM.

[BibT_eX]

[DOI]

Proceedings of the Symposium on VLSI Circuits, 2014