Sang Sik Park

According to our database, Sang Sik Park authored at least 1 paper in 2004.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2004

Effects of electrical stress on mid-gap interface trap density and capture cross sections in n-MOSFETs characterized by pulsed interface probing measurements.

Hyuck In Kwon, In Man Kang, Byung-Gook Park, Jong Duk Lee, Sang Sik Park, Jung Chak Ahn, Yong Hee Lee

Microelectron. Reliab., 2004