Semiu A. Olowogemo

According to our database, Semiu A. Olowogemo authored at least 7 papers between 2018 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2022

Understanding time-varying vulnerability accross GPU Program Lifetime.

Hao Qiu, Semiu A. Olowogemo, Bor-Tyng Lin, William H. Robinson, Daniel B. Limbrick

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies.

Semiu A. Olowogemo, Hao Qiu, Bor-Tyng Lin, William H. Robinson, Daniel B. Limbrick

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

2021

Evaluating Soft Error Mitigation Trade-offs During Early Design Stages.

Hao Qiu, Bor-Tyng Lin, Semiu A. Olowogemo, William H. Robinson, Daniel B. Limbrick

Proceedings of the Architecture of Computing Systems - 34th International Conference, 2021

2020

Gem5Panalyzer: A Light-weight tool for Early-stage Architectural Reliability Evaluation & Prediction.

Hao Qiu, Xiaoxing Qiu, Semiu A. Olowogemo, Bor-Tyng Lin, William H. Robinson, Daniel B. Limbrick

Proceedings of the 63rd IEEE International Midwest Symposium on Circuits and Systems, 2020

Electrical Masking Improvement with Standard Logic Cell Synthesis Using 45 nm Technology Node.

Semiu A. Olowogemo, Ahmed Yiwere, Bor-Tyng Lin, Hao Qiu, William H. Robinson, Daniel B. Limbrick

Proceedings of the 63rd IEEE International Midwest Symposium on Circuits and Systems, 2020

2019

Pulse Broadening in Combinational Circuits with Standard Logic Cell Synthesis.

Semiu A. Olowogemo, William H. Robinson, Ahmed Yiwere, Ebenezer Tachie-Menson, Daniel B. Limbrick, Bor-Tyng Lin

Proceedings of the 62nd IEEE International Midwest Symposium on Circuits and Systems, 2019

2018

Effects of Voltage and Temperature Variations on the Electrical Masking Capability of Sub-65 nm Combinational Logic Circuits.

Semiu A. Olowogemo, William H. Robinson, Daniel B. Limbrick

Proceedings of the 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2018