Seok Hee Jeon

According to our database, Seok Hee Jeon authored at least 3 papers between 2003 and 2005.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2005

Reliability improvement by the suppression of keyhole generation in W-plug vias.

Jong Hun Kim, Kyosun Kim, Seok Hee Jeon, Jong Tae Park

Microelectron. Reliab., 2005

2004

Reduced Hot Carrier Effects in Self-Aligned Ground-Plane FDSOI MOSFET's.

Se Re Na Yun, Chong-Gun Yu, Seok Hee Jeon, Chungkyue Kim, Jong Tae Park, Jean-Pierre Colinge

Microelectron. Reliab., 2004

2003

Increased hot carrier effects in Gate-All-Around SOI nMOSFET's.

Jong Tae Park, Nag Jong Choi, Chong-Gun Yu, Seok Hee Jeon, Jean-Pierre Colinge

Microelectron. Reliab., 2003