Chong-Gun Yu

Orcid: 0000-0003-0802-0113

According to our database¹, Chong-Gun Yu authored at least 16 papers between 1993 and 2018.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of four.

Timeline

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In proceedings

Article

PhD thesis

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Other

Bibliography

2018

Thermal energy harvesting circuit with maximum power point tracking control for self-powered sensor node applications.

[BibT_eX]

[DOI]

Eun-Jung Yoon

Jong-Tae Park

Chong-Gun Yu

Frontiers Inf. Technol. Electron. Eng., 2018

2016

Impact of work function of the silicon bottom-gates on electrical instability in InGaZnO thin film transistors.

[BibT_eX]

[DOI]

Hyun Jun Jang

Chong-Gun Yu

Jong Tae Park

Microelectron. Reliab., 2016

Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory.

[BibT_eX]

[DOI]

Jin Hyung Choi

Chong-Gun Yu

Jong Tae Park

Microelectron. Reliab., 2016

2015

Effect of source and drain asymmetry on hot carrier degradation in vertical nanowire MOSFETs.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2015

2014

Hot carrier and PBTI induced degradation in silicon nanowire gate-all-around SONOS MOSFETs.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2014

2013

A comparative study on device degradation under a positive gate stress and hot carrier stress in InGaZnO thin film transistors.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2013

2012

Drain breakdown voltage: A comparison between junctionless and inversion mode p-channel MOSFETs.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2012

2011

Effects of device layout on the drain breakdown voltages in MuGFETs.

[BibT_eX]

[DOI]

Jin-Young Kim

Chong-Gun Yu

Jong Tae Park

Microelectron. Reliab., 2011

2009

NBTI and hot carrier effect of SOI p-MOSFETs fabricated in strained Si SOI wafer.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2009

2007

Comparative study of NBTI as a function of Si film orientation and thickness in SOI pMOSFETs.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2007

2006

New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2006

2004

Reduced Hot Carrier Effects in Self-Aligned Ground-Plane FDSOI MOSFET's.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2004

2003

Increased hot carrier effects in Gate-All-Around SOI nMOSFET's.

[BibT_eX]

[DOI]

Microelectron. Reliab., 2003

1994

An automatic offset compensation scheme with ping-pong control for CMOS operational amplifiers.

[BibT_eX]

[DOI]

Chong-Gun Yu

Randall L. Geiger

IEEE J. Solid State Circuits, May, 1994

An Accurate and Matching-Free Threshold Voltage Extraction Scheme for MOS Transistors.

[BibT_eX]

[DOI]

Chong-Gun Yu

Randall L. Geiger

Proceedings of the 1994 IEEE International Symposium on Circuits and Systems, ISCAS 1994, London, England, UK, May 30, 1994

1993

Very Low Voltage Operational Amplifiers Using Floating Gate MOS Transistor.

[BibT_eX]

Chong-Gun Yu

Randall L. Geiger

Proceedings of the 1993 IEEE International Symposium on Circuits and Systems, 1993

Chong-Gun Yu

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