Sewon Jeon
Timeline
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Bibliography
2025
Reliability Characterization Using Accelerated Methods of 1Tb 9th-Gen VNAND for TLC/QLC applications.
Proceedings of the IEEE International Reliability Physics Symposium, 2025
Comparison of Machine Learning Models and NIHSS for Prognosis Prediction in Stroke Patients.
Proceedings of the International Conference on Artificial Intelligence in Information and Communication, 2025