Shigeto Fukatsu

According to our database1, Shigeto Fukatsu authored at least 2 papers between 2012 and 2013.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2013
Time-dependent dielectric breakdown (TDDB) distribution in n-MOSFET with HfSiON gate dielectrics under DC and AC stressing.
Microelectron. Reliab., 2013

2012
Lifetime prediction of channel hot carrier degradation in pMOSFETs separating NBTI component.
Proceedings of the IEEE International Conference on IC Design & Technology, 2012


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