Kikuo Yamabe

According to our database1, Kikuo Yamabe authored at least 4 papers between 2013 and 2019.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2019
Verification of Copper Stress Migration Under Low Temperature Long Time Stress.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

2017
Mechanism of gate dielectric degradation by hydrogen migration from the cathode interface.
Microelectron. Reliab., 2017

2016
Formation mechanism of concave by dielectric breakdown on silicon carbide metal-oxide-semiconductor capacitor.
Microelectron. Reliab., 2016

2013
Time-dependent dielectric breakdown (TDDB) distribution in n-MOSFET with HfSiON gate dielectrics under DC and AC stressing.
Microelectron. Reliab., 2013


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