Shin Sakai

According to our database, Shin Sakai authored at least 6 papers between 2009 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

A 5.94-μm Pixel-Pitch 25.2-Mpixel 120-Frames/s Full-Frame Global Shutter CMOS Image Sensor With Pixel-Parallel 14-bit ADC.

Masaki Sakakibara, Toshiki Kainuma, Ryo Wakamatsu, Kimitaka Wada, Tohru Takeda, Shota Ueyama, Hiroki Suto, Shin Sakai, Koji Ogawa, Koya Tsuchimoto, Kazuki Nomoto, Tsukasa Miura, Hirotsugu Takahashi, Koushi Uemura, Masao Kimura, Yusuke Oike

IEEE J. Solid State Circuits, November, 2025

2018

A 6.9-µm Pixel-Pitch Back-Illuminated Global Shutter CMOS Image Sensor With Pixel-Parallel 14-Bit Subthreshold ADC.

Masaki Sakakibara, Koji Ogawa, Shin Sakai, Yasuhisa Tochigi, Katsumi Honda, Hidekazu Kikuchi, Takuya Wada, Yasunobu Kamikubo, Tsukasa Miura, Masahiko Nakamizo, Naoki Jyo, Ryo Hayashibara, Shinya Miyata, Satoshi Yamamoto, Yoshiyuki Ota, Hirotsugu Takahashi, Tadayuki Taura, Yusuke Oike, Keiji Tatani, Takayuki Ezaki, Teruo Hirayama

IEEE J. Solid State Circuits, 2018

A back-illuminated global-shutter CMOS image sensor with pixel-parallel 14b subthreshold ADC.

Masaki Sakakibara, Koji Ogawa, Shin Sakai, Yasuhisa Tochigi, Katsumi Honda, Hidekazu Kikuchi, Takuya Wada, Yasunobu Kamikubo, Tsukasa Miura, Masahiko Nakamizo, Naoki Jyo, Ryo Hayashibara, Yohei Furukawa, Shinya Miyata, Satoshi Yamamoto, Yoshiyuki Ota, Hirotsugu Takahashi, Tadayuki Taura, Yusuke Oike, Keiji Tatani, Takashi Nagano, Takayuki Ezaki, Teruo Hirayama

Proceedings of the 2018 IEEE International Solid-State Circuits Conference, 2018

2010

Checker-pattern and shared two pixels LOFIC CMOS image sensors.

Yoshiaki Tashiro, Shun Kawada, Shin Sakai, Shigetoshi Sugawa

Proceedings of the 15th Asia South Pacific Design Automation Conference, 2010

Checkered white-RGB color LOFIC CMOS image sensor.

Shun Kawada, Shin Sakai, Yoshiaki Tashiro, Shigetoshi Sugawa

Proceedings of the 15th Asia South Pacific Design Automation Conference, 2010

2009

A pixel-shared CMOS image sensor using lateral overflow gate.

Shin Sakai, Yoshiaki Tashiro, Nana Akahane, Rihito Kuroda, Koichi Mizobuchi, Shigetoshi Sugawa

Proceedings of the 35th European Solid-State Circuits Conference, 2009