Shu-Han Hsu

According to our database, Shu-Han Hsu authored at least 12 papers between 2015 and 2026.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2026

Anomaly Detection for Circuit Waveforms Using Diffusion Model.

Hung-Wei Hsueh, Chia-Hsun Lee, Hao-Ming Hsu, Ching-Wei Tseng, Shu-Han Hsu

IEEE Trans. Consumer Electron., May, 2026

2025

Anomaly Detection Reliability in Consumer Electronics Manufacturing.

Chuen-Wun Pai, Hung-Wei Hsueh, Shu-Han Hsu

IEEE Trans. Consumer Electron., November, 2025

Diversity-based two-phase pruning strategy for maximizing image segmentation generalization with applications in transmission electron microscopy.

Ze-Wei Ye, Hung-Wei Hsueh, Shu-Han Hsu

Mach. Learn. Sci. Technol., 2025

Reliability of deep learning models for scanning electron microscopy analysis.

Chuen-Wun Pai, Hung-Wei Hsueh, Shu-Han Hsu

Mach. Learn. Sci. Technol., 2025

2023

Physics-informed graph neural networks accelerating microneedle simulations towards novelty of micro-nano scale materials discovery.

Romrawin Chumpu, Chun-Lin Chu, Tanyakarn Treeratanaphitak, Sanparith Marukatat, Shu-Han Hsu

Eng. Appl. Artif. Intell., November, 2023

2020

Optimal Accelerated Test Framework for Time-Dependent Dielectric Breakdown Lifetime Parameter Estimation.

Yi-Da Wu, Kexin Yang, Shu-Han Hsu, Linda Milor

IEEE Trans. Very Large Scale Integr. Syst., 2020

2019

Optimization of Experimental Designs for System- Level Accelerated Life Test in a Memory System Degraded by Time-Dependent Dielectric Breakdown.

Dae-Hyun Kim, Shu-Han Hsu, Linda Milor

IEEE Trans. Very Large Scale Integr. Syst., 2019

Machine Learning for Detection of Competing Wearout Mechanisms.

Shu-Han Hsu, Kexin Yang, Linda Milor

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Identification of Failure Modes for Circuit Samples with Confounded Causes of Failure.

Shu-Han Hsu, Ying-Yuan Huang, Kexin Yang, Linda Milor

Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

Reliability and Accelerated Testing of 14nm FinFET Ring Oscillators.

Shu-Han Hsu, Kexin Yang, Linda Milor

Proceedings of the XXXIV Conference on Design of Circuits and Integrated Systems, 2019

2015

Advanced germanium channel transistors (invited).

Chee Wee Liu, I.-H. Wong, Shu-Han Hsu, C.-H. Huang, Shu-Han Hsu

Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015

Advanced germanium channel transistors (invited).

Chee Wee Liu, I.-H. Wong, Shu-Han Hsu, C.-H. Huang, Shu-Han Hsu

Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015