Shu-Han Hsu

Orcid: 0000-0001-6055-9330

According to our database1, Shu-Han Hsu authored at least 7 papers between 2015 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2023
Physics-informed graph neural networks accelerating microneedle simulations towards novelty of micro-nano scale materials discovery.
Eng. Appl. Artif. Intell., November, 2023

2020
Optimal Accelerated Test Framework for Time-Dependent Dielectric Breakdown Lifetime Parameter Estimation.
IEEE Trans. Very Large Scale Integr. Syst., 2020

2019
Optimization of Experimental Designs for System- Level Accelerated Life Test in a Memory System Degraded by Time-Dependent Dielectric Breakdown.
IEEE Trans. Very Large Scale Integr. Syst., 2019

Machine Learning for Detection of Competing Wearout Mechanisms.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

Identification of Failure Modes for Circuit Samples with Confounded Causes of Failure.
Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

Reliability and Accelerated Testing of 14nm FinFET Ring Oscillators.
Proceedings of the XXXIV Conference on Design of Circuits and Integrated Systems, 2019

2015
Advanced germanium channel transistors (invited).
Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015


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