Shuhuan Liu

According to our database, Shuhuan Liu authored at least 10 papers between 2015 and 2026.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2026

Reconciling Cognitive Modeling with Knowledge Forgetting: A Continuous Time-aware General Neural Network Framework.

Ziwen Wang, Jingyuan Wang, Haiping Ma, Hengshu Zhu, Shangshang Yang, Xiaoshan Yu, Shuhuan Liu, Haifeng Zhang, Xingyi Zhang

ACM Trans. Intell. Syst. Technol., April, 2026

2025

An extended prioritized average operator and SWARA-CoCoSo decision-making integrated technique within the complex fuzzy Z-number framework.

Yunfeng Jiang, Junjun Mao, Shuhuan Liu, Zheng Zhang, Tao Wu

J. Supercomput., December, 2025

2023

Homogeneous Cohort-Aware Group Cognitive Diagnosis: A Multi-grained Modeling Perspective.

Shuhuan Liu, Xiaoshan Yu, Haiping Ma, Ziwen Wang, Chuan Qin, Xingyi Zhang

Proceedings of the 32nd ACM International Conference on Information and Knowledge Management, 2023

2021

Experimental Investigation of the Effects of Reactor Neutron-Gamma Pulse Irradiation on SiGe HBTs Under Different Bias Conditions.

Zhuoqi Li, Shuhuan Liu, Ci Song, Ning Han, Mathew Adefusika Adekoya

IEEE Access, 2021

2018

⁶⁰Co gamma radiation total ionizing dose combined with conducted electromagnetic interference studies in BJTs.

Olarewaju Mubashiru Lawal, Shuhuan Liu, Zhuoqi Li, Aqil Hussain

Microelectron. Reliab., 2018

FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoC.

Xiaozhi Du, Dongyang Luo, Kailun Shi, Chaohui He, Shuhuan Liu

J. Electron. Test., 2018

A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft Error.

Xiaozhi Du, Dongyang Luo, Chaohui He, Shuhuan Liu

J. Electron. Test., 2018

2017

Single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on chip.

Xuecheng Du, Shuhuan Liu, Dongyang Luo, Yao Zhang, Xiaozhi Du, Chaohui He, Xiaotang Ren, Weitao Yang, Yuan Yuan

Microelectron. Reliab., 2017

2015

Hot carrier effect on a single SiGe HBT's EMI response.

Cen Xiong, Yonghong Li, Shuhuan Liu, Du Tang, Jinxin Zhang, Chaohui He

Microelectron. Reliab., 2015

Hot carrier effect on the bipolar transistors' response to electromagnetic interference.

Cen Xiong, Shuhuan Liu, Yonghong Li, Du Tang, Jinxin Zhang, Xuecheng Du, Chaohui He

Microelectron. Reliab., 2015