Chaohui He

According to our database1, Chaohui He authored at least 10 papers between 2015 and 2018.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2018
Single-event multiple transients in guard-ring hardened inverter chains of different layout designs.
Microelectron. Reliab., 2018

Investigation of enhanced low dose rate sensitivity in SiGe HBTs by <sup>60</sup>Co γ irradiation under different biases.
Microelectron. Reliab., 2018

FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoC.
J. Electron. Test., 2018

A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft Error.
J. Electron. Test., 2018

2017
Single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on chip.
Microelectron. Reliab., 2017

Heavy ion micro-beam study of single-event transient (SET) in SiGe heterjunction bipolar transistor.
Sci. China Inf. Sci., 2017

2016
Time dependent modeling of single particle displacement damage in silicon devices.
Microelectron. Reliab., 2016

2015
3-D simulation study of single event effects of SiGe heterojunction bipolar transistor in extreme environment.
Microelectron. Reliab., 2015

Hot carrier effect on a single SiGe HBT's EMI response.
Microelectron. Reliab., 2015

Hot carrier effect on the bipolar transistors' response to electromagnetic interference.
Microelectron. Reliab., 2015


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