Shyang-Tai Su

According to our database, Shyang-Tai Su authored at least 5 papers between 1992 and 1995.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

1995

Transient power supply current monitoring - A new test method for CMOS VLSI circuits.

Shyang-Tai Su, Rafic Z. Makki, H. Troy Nagle

J. Electron. Test., 1995

Transient Power Supply Current Testing of Digital CMOS Circuits.

Rafic Z. Makki, Shyang-Tai Su, H. Troy Nagle

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1994

Analysis and Characterization of State Assignment Techniques for Sequential Machines.

Rafic Z. Makki, Shyang-Tai Su

VLSI Design, 1994

1992

Testing of static random access memories by monitoring dynamic power supply current.

Shyang-Tai Su, Rafic Z. Makki

J. Electron. Test., 1992

A testable static RAM structure for efficient coverage of pattern sensitive faults.

Shyang-Tai Su, Rafic Z. Makki

Proceedings of the 10th IEEE VLSI Test Symposium (VTS'92), 1992