Rafic Z. Makki

According to our database, Rafic Z. Makki authored at least 23 papers between 1986 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

Nurturing the Growth of a National Infrastructure in Emerging Technologies.

Rafic Z. Makki, Victor V. Zhirnov, Ralph K. Cavin III, Sami Issa, Marco Iansiti

Proc. IEEE, 2018

2009

On Wires Holding a Handful of Electrons.

Valeriu Beiu, Walid Ibrahim, Rafic Z. Makki

Proceedings of the Nano-Net - 4th International ICST Conference, 2009

2006

Scaling of i_DDT Test Methods for Random Logic Circuits.

Ali Chehab, Saurabh Patel, Rafic Z. Makki

J. Electron. Test., 2006

2004

Measurement and Analysis of Physical Defects for Dynamic Supply Current Testing.

Scott Thomas, Rafic Z. Makki, Sai Kishore Vavilala

Proceedings of the 2nd IEEE International Workshop on Electronic Design, 2004

2002

IDDT Test Methodologies for Very Deep Sub-micron CMOS Circuits.

Ali Chehab, Rafic Z. Makki, Michael Spica, David Wu

Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

I_DDT Testing of Embedded CMOS SRAMs.

Suriya Ashok Kumar, Rafic Z. Makki, David M. Binkley

Proceedings of the 2002 Design, 2002

2000

Dynamic Power Supply Current Testing of CMOS SRAMs.

Jian Liu, Rafic Z. Makki, Ayman I. Kayssi

J. Electron. Test., 2000

1998

Testing of Embedded Memories - The Aggregate.

Rafic Z. Makki

Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998

Dynamic Power Supply Current Testing of SRAMs.

Jian Liu, Rafic Z. Makki, Ayman I. Kayssi

Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998

1997

I_DDQ Testing Experiments for Various CMOS Logic Design Structures.

Abdulnour Y. Toukmaji, Ronald Helms, Rafic Z. Makki, Wadie Mikhail, Patrick Toole

VLSI Design, 1997

Advancements in Power Supply Current Testing.

Rafic Z. Makki

VLSI Design, 1997

1995

Transient power supply current monitoring - A new test method for CMOS VLSI circuits.

Shyang-Tai Su, Rafic Z. Makki, H. Troy Nagle

J. Electron. Test., 1995

Transient Power Supply Current Testing of Digital CMOS Circuits.

Rafic Z. Makki, Shyang-Tai Su, H. Troy Nagle

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

Power supply current detectability of SRAM defects.

Jian Liu, Rafic Z. Makki

Proceedings of the 4th Asian Test Symposium (ATS '95), 1995

1994

Pioneer: A New Tool for Coding of Multi-Level Finite State Machines Based on Evolution Programming.

Subbu Muddappa, Rafic Z. Makki, Zbigniew Michalewicz, Sridhar Isukapalli

VLSI Design, 1994

Analysis and Characterization of State Assignment Techniques for Sequential Machines.

Rafic Z. Makki, Shyang-Tai Su

VLSI Design, 1994

1992

Testing of static random access memories by monitoring dynamic power supply current.

Shyang-Tai Su, Rafic Z. Makki

J. Electron. Test., 1992

A testable static RAM structure for efficient coverage of pattern sensitive faults.

Shyang-Tai Su, Rafic Z. Makki

Proceedings of the 10th IEEE VLSI Test Symposium (VTS'92), 1992

1991

Automatic Test Pattern Generation with Branch Testing.

Rafic Z. Makki, Silvio Bou-Ghazale, Chen Tianshang

IEEE Trans. Computers, 1991

On the Integration of Design and Manufacturing for Improved Testability.

Rafic Z. Makki, Kasra Daneshvar, Farid Tranjan, Richard Greene

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1990

Practical partitioning for testability with time-shared boundary scan.

Rafic Z. Makki, Krisbnm Palaniswami

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

SSC-a tool for the synthesis of testable sequential machines.

Rafic Z. Makki, J. Muha, Silvio Bou-Ghazale, T. Kaylani

Proceedings of the Intellectual Leverage: Thirty-Fifth IEEE Computer Society International Conference, 1990

1986

Designing Testable Control Paths with Multiple and Feedback Scan-Paths.

Rafic Z. Makki, C. Tiansheng

Proceedings of the Proceedings International Test Conference 1986, 1986