Soh Yun Siah
According to our database1,
Soh Yun Siah authored at least 6 papers
between 2008 and 2020.
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Bibliography
2020
Magnetic Immunity Guideline for Embedded MRAM Reliability to Realize Mass Production.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2012
The role of a tensile stress bias for a sensitive silicon mechanical stress sensor based on a change in gate-induced-drain leakage current.
Microelectron. Reliab., 2012
2010
Observation of halo implant from the drain side reaching the source side and vice versa in extremely short p-channel transistors.
Microelectron. Reliab., 2010
2009
Drain current saturation at high drain voltage due to pinch off instead of velocity saturation in sub-100 nm metal-oxide-semiconductor transistors.
Microelectron. Reliab., 2009
2008
An explanation of the dependence of the effective saturation velocity on gate voltage in sub-0.1 µm metal-oxide-semiconductor transistors by quasi-ballistic transport theory.
Microelectron. Reliab., 2008
A study of the linearity between I<sub>on</sub> and log I<sub>off</sub> of modern MOS transistors and its application to stress engineering.
Microelectron. Reliab., 2008