Taeyoung Lee
Orcid: 0009-0004-8849-4822Affiliations:
- Samsung Electronics, Suwon, Korea
According to our database1,
Taeyoung Lee authored at least 4 papers
between 2020 and 2024.
Collaborative distances:
Collaborative distances:
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Bibliography
2024
14nm FinFET Node Embedded MRAM Technology for Automotive Non-Volatile RAM Applications with Endurance Over 1E12-Cycles.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024
2022
A Physics based MTJ Compact Model for State-of-the-Art and Emerging STT-MRAM Failure Analysis and Yield Enhancement.
Proceedings of the IEEE International Memory Workshop, 2022
2021
Proceedings of the 3rd IEEE International Conference on Artificial Intelligence Circuits and Systems, 2021
2020
Magnetic Immunity Guideline for Embedded MRAM Reliability to Realize Mass Production.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020