Peizhen Yang

Orcid: 0009-0008-5231-1472

According to our database1, Peizhen Yang authored at least 13 papers between 2008 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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PhD thesis 
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Links

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Bibliography

2024
FedAVE: Adaptive data value evaluation framework for collaborative fairness in federated learning.
Neurocomputing, March, 2024

Robust Optical and SAR Image Matching Using Attention-Enhanced Structural Features.
IEEE Trans. Geosci. Remote. Sens., 2024

ConTIG: Continuous representation learning on temporal interaction graphs.
Neural Networks, 2024

2023
Perturbing a Neural Network to Infer Effective Connectivity: Evidence from Synthetic EEG Data.
CoRR, 2023

Exploiting Neighborhood Structural Features for Change Detection.
CoRR, 2023

Dangoron: Network Construction on Large-scale Time Series Data across Sliding Windows.
Proceedings of the Companion of the 2023 International Conference on Management of Data, 2023

FedGS: Federated Graph-Based Sampling with Arbitrary Client Availability.
Proceedings of the Thirty-Seventh AAAI Conference on Artificial Intelligence, 2023

2021
ConTIG: Continuous Representation Learning on Temporal Interaction Graphs.
CoRR, 2021

2012
The role of a tensile stress bias for a sensitive silicon mechanical stress sensor based on a change in gate-induced-drain leakage current.
Microelectron. Reliab., 2012

2010
Observation of halo implant from the drain side reaching the source side and vice versa in extremely short p-channel transistors.
Microelectron. Reliab., 2010

2009
Drain current saturation at high drain voltage due to pinch off instead of velocity saturation in sub-100 nm metal-oxide-semiconductor transistors.
Microelectron. Reliab., 2009

2008
An explanation of the dependence of the effective saturation velocity on gate voltage in sub-0.1 µm metal-oxide-semiconductor transistors by quasi-ballistic transport theory.
Microelectron. Reliab., 2008

A study of the linearity between I<sub>on</sub> and log I<sub>off</sub> of modern MOS transistors and its application to stress engineering.
Microelectron. Reliab., 2008


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