Sravan Kumar Bhaskarani

According to our database, Sravan Kumar Bhaskarani authored at least 3 papers in 2007.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2007

Low Area Adaptive Fail-Data Compression Methodology for Defect Classification and Production Phase Prognosis.

Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani

Proceedings of the 2007 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2007), 2007

GALS Based Shared Test Architecture for Embedded Memories.

Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2007), 2007

Built in Defect Prognosis for Embedded Memories.

Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani

Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), 2007