Summer F. C. Tseng

According to our database1, Summer F. C. Tseng authored at least 3 papers between 2003 and 2004.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2004
Some practical considerations for effective and efficient wafer-level reliability control.
Microelectron. Reliab., 2004

2003
A cost-effective wafer-level reliability test system for integrated circuit makers.
IEEE Trans. Instrum. Meas., 2003

Improvement of poly-silicon hole induced gate oxide failure by silicon rich oxidation.
Microelectron. Reliab., 2003


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