Wei-Ting Kary Chien

According to our database, Wei-Ting Kary Chien authored at least 17 papers between 2003 and 2019.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2019

Fast Semiconductor Reliability Assessments Using SPRT.

Wei-Ting Kary Chien, Andrew Chung, Way Kuo

IEEE Trans. Reliab., 2019

2018

Investigations and detections on a new BEOL dielectric failure mechanism at advanced technologies.

Wei-Ting Kary Chien, Atman Yong Zhao, Liwen Zhang, Zhijuan Wang

Microelectron. Reliab., 2018

2017

Exploration of baking temperature effects on 28 nm BEOL reliability.

Xiangfu Zhao, Wei-Ting Kary Chien

Microelectron. Reliab., 2017

2016

Early detection and prediction of HKMG SRAM HTOL performance by WLR PBTI tests.

Wei-Ting Kary Chien, Atman Yong Zhao, Yueqin Zhu, Yongliang Song

Microelectron. Reliab., 2016

Influence of I/O oxide process on the NBTI performance of 28 nm HfO₂-based HKMG p-MOSFETs.

Wei-Ting Kary Chien, Yueqin Zhu, Yongliang Song, Atman Yong Zhao

Microelectron. Reliab., 2016

2015

Electromigration Lifetime Optimization by Uniform Designs and a New Lifetime Index.

Siyuan Frank Yang, Wei-Ting Kary Chien

IEEE Trans. Reliab., 2015

The reversed intrinsic curve and voltage dependence for ultra-low k dielectrics.

Wei-Ting Kary Chien, Atman Yong Zhao, Liwen Zhang, Flora Cheng

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Comprehensive Wafer Level Package Die Processing Service quality control enhancement.

John Qiao, Morn Jin, Wenwen He, Wei-Ting Kary Chien, Shirley Zhao

Proceedings of the 2015 IEEE International Conference on Industrial Engineering and Engineering Management, 2015

Wafer level package wafer probing shift error-proof quality control.

Morn Jin, Wenwen He, John Qiao, Wei-Ting Kary Chien, Shirley Zhao

Proceedings of the 2015 IEEE International Conference on Industrial Engineering and Engineering Management, 2015

The investigation of semiconductor shipping bag reliability.

Hailin Jonson Gao, Xueliang Ruben Zhang, Yanju Lisa Yu, Kaiyuan Kevin Chang, Wei-Ting Kary Chien

Proceedings of the 2015 IEEE International Conference on Industrial Engineering and Engineering Management, 2015

2014

A study on the optimization of wafer pre-treatment conditions for thin film stability monitor.

Taicheng Kevin Gong, Yanju Lisa Yu, Yan Kaily Cao, Xueliang Ruben Zhang, Kaiyuan Kevin Chang, Wei-Ting Kary Chien

Proceedings of the 2014 IEEE International Conference on Industrial Engineering and Engineering Management, 2014

2012

Editorial: Reduce Time-to-Market by Considering Reliability Tradeoffs.

Wei-Ting Kary Chien, Ming Li

IEEE Trans. Reliab., 2012

2010

A Practical, Innovative Method for Electro-Static Discharge Data Analysis.

Wei-Ting Kary Chien, Siyuan Frank Yang

IEEE Trans. Reliab., 2010

2007

A New Method to Determine the Reliability Comparability for Products, Components, and Systems in Reliability Testing.

Wei-Ting Kary Chien, Siyuan Frank Yang

IEEE Trans. Reliab., 2007

2004

Some practical considerations for effective and efficient wafer-level reliability control.

Summer F. C. Tseng, Wei-Ting Kary Chien, Excimer Gong, Willings Wang, Bing-Chu Cai

Microelectron. Reliab., 2004

2003

A cost-effective wafer-level reliability test system for integrated circuit makers.

Summer Fan-Chung Tseng, Wei-Ting Kary Chien, Excimer Gong, Bing-Chu Cai

IEEE Trans. Instrum. Meas., 2003

Improvement of poly-silicon hole induced gate oxide failure by silicon rich oxidation.

Summer F. C. Tseng, Wei-Ting Kary Chien, Bing-Chu Cai

Microelectron. Reliab., 2003