T. Schaefer

According to our database1, T. Schaefer authored at least 2 papers between 1978 and 2015.

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Bibliography

2015
Assessing intrinsic and extrinsic end-of-life risk using functional SRAM wafer level testing.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

1978
The Complexity of Checkers on an N * N Board - Preliminary Report
Proceedings of the 19th Annual Symposium on Foundations of Computer Science, 1978


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