Randy W. Mann

According to our database, Randy W. Mann authored at least 18 papers between 1995 and 2020.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2020

Bias-Dependent Variation in FinFET SRAM.

Randy W. Mann, Meixiong Zhao, Oh Sung Kwon, Xi Cao, Sanjay Parihar, Muhammed Ahosan Ul Karim, Jack M. Higman, Joseph Versaggi, Rick Carter

IEEE Trans. Very Large Scale Integr. Syst., 2020

2019

An Extrinsic Device and Leakage Mechanism in Advanced Bulk FinFET SRAM.

Randy W. Mann, Meixiong Zhao, Sanjay Parihar, Qun Gao, Ankur Arya, Carl Radens, Shesh Mani Pandey, Joseph Versaggi, Jack M. Higman, Rick Carter

IEEE Trans. Very Large Scale Integr. Syst., 2019

2018

A Retrospective View on the Technology Evolution to Support Low Power Mobile Application.

Bipul C. Paul, Ajey P. Jacob, William Taylor, Randy W. Mann, Joseph Versaggi, Edward J. Nowak, Lars W. Liebmann

J. Low Power Electron., 2018

2017

Array Termination Impacts in Advanced SRAM.

Randy W. Mann, Sandeep Puri, Sheng Xie, Daniel Marienfeld, Joseph Versaggi, Bianzhu Fu, Michael Gribelyuk, Ratheesh R. Thankalekshmi, Xiaoqiang Zhang, Hui Zang, Chad E. Weintraub

IEEE Trans. Very Large Scale Integr. Syst., 2017

Bias-Induced Healing of $V_{\text {min}}$ Failures in Advanced SRAM Arrays.

Randy W. Mann, William McMahon, Yoann Mamy Randriamihaja, Yuncheng Song, Ajay Anand Kallianpur, Sheng Xie, Akhilesh Gautam, Joseph Versaggi, Biju Parameshwaran, Chad E. Weintraub

IEEE Trans. Very Large Scale Integr. Syst., 2017

Soft errors: Reliability challenges in energy-constrained ULP body sensor networks applications.

Harsh N. Patel, Benton H. Calhoun, Randy W. Mann

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

2015

Assessing intrinsic and extrinsic end-of-life risk using functional SRAM wafer level testing.

Yoann Mamy Randriamihaja, William McMahon, S. Balasubramanian, Tanya Nigam, Biju Parameshwaran, Randy W. Mann, Torsten Klick, T. Schaefer, A. Kumar, Y. Song, Vivek Joshi, Rakesh Ranjan, F. Chen

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

HTOL SRAM Vmin shift considerations in scaled HKMG technologies.

S. Balasubramanian, Vivek Joshi, Torsten Klick, Randy W. Mann, Joseph Versaggi, Akhilesh Gautam, C. Weintraub, G. Kurz, G. Krause, Andreas Kerber, Biju Parameshwaran, Tanya Nigam

Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 2014

2012

Tracking On-Chip Age Using Distributed, Embedded Sensors.

Stuart N. Wooters, Adam C. Cabe, Zhenyu Qi, Jiajing Wang, Randy W. Mann, Benton H. Calhoun, Mircea R. Stan, Travis N. Blalock

IEEE Trans. Very Large Scale Integr. Syst., 2012

Nonrandom Device Mismatch Considerations in Nanoscale SRAM.

Randy W. Mann, Terry B. Hook, Phung T. Nguyen, Benton H. Calhoun

IEEE Trans. Very Large Scale Integr. Syst., 2012

2011

New category of ultra-thin notchless 6T SRAM cell layout topologies for sub-22nm.

Randy W. Mann, Benton H. Calhoun

Proceedings of the 12th International Symposium on Quality Electronic Design, 2011

2010

Limits of bias based assist methods in nano-scale 6T SRAM.

Randy W. Mann, Satyanand Nalam, Jiajing Wang, Benton H. Calhoun

Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010

Improving SRAM Vmin and yield by using variation-aware BTI stress.

Jiajing Wang, Satyanand Nalam, Zhenyu Qi, Randy W. Mann, Mircea R. Stan, Benton H. Calhoun

Proceedings of the IEEE Custom Integrated Circuits Conference, 2010

2009

Sub-threshold Circuit Design with Shrinking CMOS Devices.

Benton H. Calhoun, Sudhanshu Khanna, Randy W. Mann, Jiajing Wang

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2009), 2009

2003

Ultralow-power SRAM technology.

Randy W. Mann, W. W. (Bill) Abadeer, Matthew J. Breitwisch, O. Bula, Jeff S. Brown, Bryant C. Colwill, Peter E. Cottrell, William T. Crocco Jr., Stephen S. Furkay, Michael J. Hauser, Terence B. Hook, Dennis Hoyniak, James M. Johnson, Chung Hon Lam, Rebecca D. Mih, J. Rivard, Atsushi Moriwaki, E. Phipps, Christopher S. Putnam, BethAnn Rainey, James J. Toomey, Mohammad Imran Younus

IBM J. Res. Dev., 2003

2001

Enchanced multi-threshold (MTCMOS) circuits using variable well bias.

Stephen V. Kosonocky, Michael Immediato, Peter E. Cottrell, Terence B. Hook, Randy W. Mann, Jeff Brown

Proceedings of the 2001 International Symposium on Low Power Electronics and Design, 2001

1995

Silicides and local interconnections for high-performance VLSI applications.

Randy W. Mann, Larry A. Clevenger, Paul D. Agnello, Francis R. White

IBM J. Res. Dev., 1995

A half-micron CMOS logic generation.

Charles W. Koburger III, William F. Clark, James W. Adkisson, Eric Adler, Paul E. Bakeman, Albert S. Bergendahl, Alan B. Botula, W. Chang, Bijan Davari, John H. Givens, Howard H. Hansen, Steven J. Holmes, David V. Horak, Chung Hon Lam, Jerome B. Lasky, Stephen E. Luce, Randy W. Mann, Glen L. Miles, James S. Nakos, Edward J. Nowak, Ghavam G. Shahidi, Yuan Taur, Francis R. White, Matthew R. Wordeman

IBM J. Res. Dev., 1995