Taewoo Han

According to our database, Taewoo Han authored at least 9 papers between 2009 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2017

An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time.

Hyunggoy Oh, Taewoo Han, Inhyuk Choi, Sungho Kang

IEEE Trans. Computers, 2017

2016

Parallelized Network-on-Chip-Reused Test Access Mechanism for Multiple Identical Cores.

Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

2015

Majority-Based Test Access Mechanism for Parallel Testing of Multiple Identical Cores.

Taewoo Han, Inhyuk Choi, Sungho Kang

IEEE Trans. Very Large Scale Integr. Syst., 2015

2014

A novel test access mechanism for parallel testing of multi-core system.

Taewoo Han, Inhyuk Choi, Sungho Kang

IEICE Electron. Express, 2014

A Scalable and Parallel Test Access Strategy for NoC-Based Multicore System.

Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2013

Bit transmission error correction scheme for FlexRay based automotive communication systems.

Inhyuk Choi, Taewoo Han, Sungho Kang

Proceedings of the IEEE 2nd Global Conference on Consumer Electronics, 2013

2011

Path search engine for fast optimal path search using efficient hardware architecture.

Inhyuk Choi, Taewoo Han, Ilwoong Kim, Sungho Kang

Proceedings of the International SoC Design Conference, 2011

2010

An Advanced BIRA for Memories With an Optimal Repair Rate and Fast Analysis Speed by Using a Branch Analyzer.

Woosik Jeong, Joohwan Lee, Taewoo Han, Kaangchil Lee, Sungho Kang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010

2009

An Effective Programmable Memory BIST for Embedded Memory.

Youngkyu Park, Jaeseok Park, Taewoo Han, Sungho Kang

IEICE Trans. Inf. Syst., 2009