Inhyuk Choi

According to our database, Inhyuk Choi authored at least 19 papers between 2011 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

P2Cache: An Application-Directed Page Cache for Improving Performance of Data-Intensive Applications.

Dusol Lee, Inhyuk Choi, Chanyoung Lee, Sungjin Lee, Jihong Kim

Proceedings of the 15th ACM/USENIX Workshop on Hot Topics in Storage and File Systems, 2023

Integrated Host-SSD Mapping Table Management for Improving User Experience of Smartphones.

Yoona Kim, Inhyuk Choi, Juhyung Park, Jaeheon Lee, Sungjin Lee, Jihong Kim

Proceedings of the 21st USENIX Conference on File and Storage Technologies, 2023

2022

Alohomora: protecting files from ransomware attacks using fine-grained I/O whitelisting.

Sanggu Lee, Yoona Kim, Dusol Lee, Inhyuk Choi, Jihong Kim

Proceedings of the HotStorage '22: 14th ACM Workshop on Hot Topics in Storage and File Systems, Virtual Event, June 27, 2022

2020

Analysis of Thermal Sensitivity by High Voltage Insulator Materials.

Taeyong Kim, Simpy Sanyal, Ja-Bin Koo, Ju-Am Son, Inhyuk Choi, Junsin Yi

IEEE Access, 2020

2018

Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost.

Inhyuk Choi, Hyunggoy Oh, Young-Woo Lee, Sungho Kang

IEEE Trans. Computers, 2018

2017

An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time.

Hyunggoy Oh, Taewoo Han, Inhyuk Choi, Sungho Kang

IEEE Trans. Computers, 2017

DRAM-Based Error Detection Method to Reduce the Post-Silicon Debug Time for Multiple Identical Cores.

Hyunggoy Oh, Inhyuk Choi, Sungho Kang

IEEE Trans. Computers, 2017

Test item priority estimation for high parallel test efficiency under ATE debug time constraints.

Young-Woo Lee, Inhyuk Choi, Kang-Hoon Oh, James Jinsoo Ko, Sungho Kang

Proceedings of the International Test Conference in Asia, 2017

2016

Parallelized Network-on-Chip-Reused Test Access Mechanism for Multiple Identical Cores.

Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

A TSV test structure for simultaneously detecting resistive open and bridge defects in 3D-ICs.

Young-Woo Lee, Junghwan Kim, Inhyuk Choi, Sungho Kang

Proceedings of the International SoC Design Conference, 2016

Process variation-aware bridge fault analysis.

Heetae Kim, Inhyuk Choi, Jaeil Lim, Hyunggoy Oh, Sungho Kang

Proceedings of the International SoC Design Conference, 2016

Software-based embedded core test using multi-polynomial for test data reduction.

Soyeon Kang, Inhyuk Choi, Hyeonchan Lim, Sungyoul Seo, Sungho Kang

Proceedings of the International SoC Design Conference, 2016

A new online test and debug methodology for automotive camera image processing system.

Hyunggoy Oh, Inhyuk Choi, Sungho Kang

Proceedings of the 2016 IEEE Asia Pacific Conference on Circuits and Systems, 2016

Test access mechaism for stack test time reduction of 3-dimensional integrated circuit.

Inhyuk Choi, Hyunggoy Oh, Sungho Kang

Proceedings of the 2016 IEEE Asia Pacific Conference on Circuits and Systems, 2016

2015

Majority-Based Test Access Mechanism for Parallel Testing of Multiple Identical Cores.

Taewoo Han, Inhyuk Choi, Sungho Kang

IEEE Trans. Very Large Scale Integr. Syst., 2015

2014

A novel test access mechanism for parallel testing of multi-core system.

Taewoo Han, Inhyuk Choi, Sungho Kang

IEICE Electron. Express, 2014

A Scalable and Parallel Test Access Strategy for NoC-Based Multicore System.

Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang

Proceedings of the 23rd IEEE Asian Test Symposium, 2014

2013

Bit transmission error correction scheme for FlexRay based automotive communication systems.

Inhyuk Choi, Taewoo Han, Sungho Kang

Proceedings of the IEEE 2nd Global Conference on Consumer Electronics, 2013

2011

Path search engine for fast optimal path search using efficient hardware architecture.

Inhyuk Choi, Taewoo Han, Ilwoong Kim, Sungho Kang

Proceedings of the International SoC Design Conference, 2011