Taishi Takasawa

According to our database1, Taishi Takasawa authored at least 9 papers between 2011 and 2018.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2018
Multi-Aperture-Based Probabilistic Noise Reduction of Random Telegraph Signal Noise and Photon Shot Noise in Semi-Photon-Counting Complementary-Metal-Oxide-Semiconductor Image Sensor.
Sensors, 2018

2015
11.2 A 10.8ps-time-resolution 256×512 image sensor with 2-Tap true-CDS lock-in pixels for fluorescence lifetime imaging.
Proceedings of the 2015 IEEE International Solid-State Circuits Conference, 2015

6.4 Single-shot 200Mfps 5×3-aperture compressive CMOS imager.
Proceedings of the 2015 IEEE International Solid-State Circuits Conference, 2015

2014
RTS Noise and Dark Current White Defects Reduction Using Selective Averaging Based on a Multi-Aperture System.
Sensors, 2014

Lock-in pixels readout circuit using a high speed lateral electric field modulator with differential charge accumulation for stimulated Raman scattering imager.
Proceedings of the IEEE 12th International New Circuits and Systems Conference, 2014

7.5 A 0.3mm-resolution Time-of-Flight CMOS range imager with column-gating clock-skew calibration.
Proceedings of the 2014 IEEE International Conference on Solid-State Circuits Conference, 2014

7.4 A 413×240-pixel sub-centimeter resolution Time-of-Flight CMOS image sensor with in-pixel background canceling using lateral-electric-field charge modulators.
Proceedings of the 2014 IEEE International Conference on Solid-State Circuits Conference, 2014

2012
A Low-Noise High Intrascene Dynamic Range CMOS Image Sensor With a 13 to 19b Variable-Resolution Column-Parallel Folding-Integration/Cyclic ADC.
IEEE J. Solid State Circuits, 2012

2011
An 80μVrms-temporal-noise 82dB-dynamic-range CMOS Image Sensor with a 13-to-19b variable-resolution column-parallel folding-integration/cyclic ADC.
Proceedings of the IEEE International Solid-State Circuits Conference, 2011


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